Reconfiguration-Based Built-In Self-Test for Analogue Front-End Circuits
نویسندگان
چکیده
Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial selftest on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.
منابع مشابه
Low Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)
Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...
متن کاملOTA-C Based BIST Structure for Analog Circuits
In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signa...
متن کاملFlexible embedded test solution for high-speed analogue front-end architectures - Circuits, Devices and Systems, IEE Proceedings [see also IEE Proceedings G- Circuits, Devices and
A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip...
متن کاملBuilt-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing
Transient Response Testing has been shown to be a very powerful and economical functional test technique for linear analogue cells in mixed-signal systems. Recently this work has been extended to non-linear analogue circuits by treating Transient Response Testing as a structural test technique and employing optimised and reduced fault sets that are derived from Inductive Fault Analysis and circ...
متن کاملDesigning of Testable Reversible QCA Circuits Using a New Reversible MUX 2×1
Recently testing of Quantum-dot Cellular Automata (QCA) Circuits has attracted a lot of attention. In this paper, QCA is investigated for testable implementations of reversible logic. To amplify testability in Reversible QCA circuits, a test method regarding to Built In Self Test technique is developed for detecting all simulated defects. A new Reversible QCA MUX 2×1 desig...
متن کامل